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Microscopy, Atomic Force
Atomic Force Microscopies; Force Microscopies; Force Microscopies, Scanning; Force Microscopy, Scanning; Microscopies, Atomic Force; Microscopies, Force; Microscopies, Scanning Force; Microscopy, Force; Microscopy, Scanning Force
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.